DocumentCode
1963672
Title
Optimized conditions for flow modulation epitaxy of GaN
Author
Emerson, D.T. ; Smart, J.A. ; Shealy, J.R. ; Kong, H.S. ; Edmond, J.A.
Author_Institution
Sch. of Electr. Eng., Cornell Univ., Ithaca, NY, USA
fYear
1997
fDate
11-13 Aug. 1997
Firstpage
13
Lastpage
14
Abstract
Flow modulation epitaxy (FME) has been employed previously to synthesize III-V arsenides and phosphides. However, the ability of FME to extend growth to lower temperatures than those required for conventional organometallic vapor phase epitaxy (OMVPE) has only recently been explored for the synthesis of nitride based semiconductors. Because, in part, of the importance of low temperature growth to the synthesis of indium-containing group III-nitrides, this growth technique should be explored further. In this paper we report on the FME of group III-nitride compounds on sapphire and silicon carbide substrates.
Keywords
III-V semiconductors; gallium compounds; semiconductor epitaxial layers; semiconductor growth; vapour phase epitaxial growth; GaN; flow modulation epitaxy; group III-nitride; low temperature growth; semiconductor; Atomic force microscopy; Atomic measurements; Epitaxial growth; Force measurement; Gallium nitride; Optical films; Phase modulation; Silicon carbide; Substrates; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Vertical-Cavity Lasers, Technologies for a Global Information Infrastructure, WDM Components Technology, Advanced Semiconductor Lasers and Applications, Gallium Nitride Materials, Processing, and Devi
Conference_Location
Montreal, Que., Canada
Print_ISBN
0-7803-3891-X
Type
conf
DOI
10.1109/LEOSST.1997.619240
Filename
619240
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