• DocumentCode
    1963741
  • Title

    A methodology for the generation of dynamic compact models of packages and heat sinks from thermal transient measurements

  • Author

    Rencz, M. ; Farkas, G. ; Poppe, A. ; Székely, V. ; Courtois, B.

  • Author_Institution
    MicReD, Budapest, Hungary
  • fYear
    2003
  • fDate
    16-18 July 2003
  • Firstpage
    117
  • Lastpage
    123
  • Abstract
    In this paper we present a methodology that we have recently elaborated for the generation of transient compact models of packages and heat sinks entirely from measured thermal transient results. The main advantage of generating the models from measured results is the time-gain. We do not need to build up the detailed structural model of the package or the heat sink in order to simulate it, as suggested by the DELPHI methodology. An additional advantage is that the lengthy transient simulations are not needed. In the paper we first summarize the way of generating the compact models of packages and heat sinks from measurements. After this we present how to use the obtained dynamic compact package models in board level simulators, that are extended with the feature of calculating with compact models.
  • Keywords
    heat sinks; semiconductor device packaging; transients; DELPHI methodology; board level simulators; dynamic compact package models; heat sinks; lengthy transient simulations; thermal transient measurements; time gain; transient compact models; Boundary conditions; Capacitance; Circuit simulation; Computational fluid dynamics; Heat sinks; Optimization methods; Packaging; Printed circuits; Steady-state; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Manufacturing Technology Symposium, 2003. IEMT 2003. IEEE/CPMT/SEMI 28th International
  • ISSN
    1089-8190
  • Print_ISBN
    0-7803-7933-0
  • Type

    conf

  • DOI
    10.1109/IEMT.2003.1225887
  • Filename
    1225887