DocumentCode :
1963741
Title :
A methodology for the generation of dynamic compact models of packages and heat sinks from thermal transient measurements
Author :
Rencz, M. ; Farkas, G. ; Poppe, A. ; Székely, V. ; Courtois, B.
Author_Institution :
MicReD, Budapest, Hungary
fYear :
2003
fDate :
16-18 July 2003
Firstpage :
117
Lastpage :
123
Abstract :
In this paper we present a methodology that we have recently elaborated for the generation of transient compact models of packages and heat sinks entirely from measured thermal transient results. The main advantage of generating the models from measured results is the time-gain. We do not need to build up the detailed structural model of the package or the heat sink in order to simulate it, as suggested by the DELPHI methodology. An additional advantage is that the lengthy transient simulations are not needed. In the paper we first summarize the way of generating the compact models of packages and heat sinks from measurements. After this we present how to use the obtained dynamic compact package models in board level simulators, that are extended with the feature of calculating with compact models.
Keywords :
heat sinks; semiconductor device packaging; transients; DELPHI methodology; board level simulators; dynamic compact package models; heat sinks; lengthy transient simulations; thermal transient measurements; time gain; transient compact models; Boundary conditions; Capacitance; Circuit simulation; Computational fluid dynamics; Heat sinks; Optimization methods; Packaging; Printed circuits; Steady-state; Thermal resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Manufacturing Technology Symposium, 2003. IEMT 2003. IEEE/CPMT/SEMI 28th International
ISSN :
1089-8190
Print_ISBN :
0-7803-7933-0
Type :
conf
DOI :
10.1109/IEMT.2003.1225887
Filename :
1225887
Link To Document :
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