DocumentCode
1963741
Title
A methodology for the generation of dynamic compact models of packages and heat sinks from thermal transient measurements
Author
Rencz, M. ; Farkas, G. ; Poppe, A. ; Székely, V. ; Courtois, B.
Author_Institution
MicReD, Budapest, Hungary
fYear
2003
fDate
16-18 July 2003
Firstpage
117
Lastpage
123
Abstract
In this paper we present a methodology that we have recently elaborated for the generation of transient compact models of packages and heat sinks entirely from measured thermal transient results. The main advantage of generating the models from measured results is the time-gain. We do not need to build up the detailed structural model of the package or the heat sink in order to simulate it, as suggested by the DELPHI methodology. An additional advantage is that the lengthy transient simulations are not needed. In the paper we first summarize the way of generating the compact models of packages and heat sinks from measurements. After this we present how to use the obtained dynamic compact package models in board level simulators, that are extended with the feature of calculating with compact models.
Keywords
heat sinks; semiconductor device packaging; transients; DELPHI methodology; board level simulators; dynamic compact package models; heat sinks; lengthy transient simulations; thermal transient measurements; time gain; transient compact models; Boundary conditions; Capacitance; Circuit simulation; Computational fluid dynamics; Heat sinks; Optimization methods; Packaging; Printed circuits; Steady-state; Thermal resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Manufacturing Technology Symposium, 2003. IEMT 2003. IEEE/CPMT/SEMI 28th International
ISSN
1089-8190
Print_ISBN
0-7803-7933-0
Type
conf
DOI
10.1109/IEMT.2003.1225887
Filename
1225887
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