DocumentCode
1964288
Title
The impact of moisture in mold compound preforms on the warpage of PBGA packages
Author
Lin, T.Y. ; Njoman, B. ; Crouthamel, D. ; Chua, K.H. ; Teo, S.Y.
Author_Institution
Agere Syst. Singapore Pte Ltd., Singapore
fYear
2003
fDate
16-18 July 2003
Firstpage
273
Lastpage
278
Abstract
The moisture in the mold compound preforms influenced the resultant mechanical properties as well as the warpage of IC packages after molding and post mold curing (PMC) process. The moisture will diffuse into the mold compound preforms (compound pallet) after thawing from cold room and exposing to the clean room condition before molding process. The moisture will swell the package and combine with thermal stress, and finally result in the warpage of molded package after molding process. The main objective of this paper is to address the impact of moisture in the compound preforms on the warpage of the PBGA packages and explain the resultant mechanical properties changes under the different moisture conditions, e.g., the variations of the flexural modulus, Tg, and CTE with respect to the moisture level. The actual compound preforms exposure to a clean room condition, were simulated by a series of experiments. The warpage of PBGA packages were measured in terms of moire test. The moisture control during the IC manufacturing process was highlighted in terms of the mechanical properties variation and warpage measurement due to the moisture effects on the mold compound performs.
Keywords
ball grid arrays; bending strength; clean rooms; curing; manufacturing processes; moisture control; moulding; plastic packaging; thermal stresses; IC manufacturing process; IC packages; PBGA package warpage; clean room condition; cold room; flexural modulus; mechanical properties; moire test; moisture control; moisture impact; mold compound; molding process; post mold curing process; thermal stress; Curing; Integrated circuit packaging; Manufacturing processes; Mechanical factors; Mechanical variables measurement; Moisture control; Moisture measurement; Preforms; Testing; Thermal stresses;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Manufacturing Technology Symposium, 2003. IEMT 2003. IEEE/CPMT/SEMI 28th International
ISSN
1089-8190
Print_ISBN
0-7803-7933-0
Type
conf
DOI
10.1109/IEMT.2003.1225913
Filename
1225913
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