DocumentCode :
1964354
Title :
A 4-GHz all digital fractional-N PLL with low-power TDC and big phase-error compensation
Author :
Lee, Ja-Yol ; Park, Mi-Jeong ; Mhin, Byonghoon ; Kim, Seong-Do ; Park, Moon-Yang ; Yu, Hyunku
Author_Institution :
Electron. & Telecommun. Res. Inst., Daejeon, South Korea
fYear :
2011
fDate :
19-21 Sept. 2011
Firstpage :
1
Lastpage :
4
Abstract :
This paper presents an all-digital fractional-N PLL with a low-power TDC operating at the retimed reference clock. Two retimed reference clocks are employed to implement the proposed TDC estimating the fractional phase error between the reference clock and CKV clock. The application of the retimed reference clocks to TDC does not only reduce dynamic power in TDC delay inverter chain, but also simplify εr estimation including a new Tv calculation algorithm. Also, phase-error compensation block is presented to compensate for the big phase-error change due to timing skew in the output bits produced from variable-phase counter. And loop settling scanning block is invented to shift DCO operation mode and additionally decrease PLL channel switching time for frequency hopping applications. The proposed all-digital PLL represents -36dBc integrated phase noise (1kHz - 20MHz), 778fs rms jitter, 9.6mW power consumption. The channel switching time of the ADPLL is measured as 630nsec.
Keywords :
clocks; delays; digital phase locked loops; error compensation; invertors; low-power electronics; CKV clock; PLL channel switching time; Tν calculation algorithm; TDC delay inverter chain; TDC estimation; all digital fractional-N PLL; big phase-error change; dynamic power reduction; fractional phase error; frequency 1 kHz to 20 MHz; frequency 4 GHz; frequency hopping application; loop settling scanning block; low-power TDC; phase-error compensation block; power 9.6 mW; retimed reference clock; shift DCO operation mode; time 630 ns; timing skew; variable-phase counter; Clocks; Frequency measurement; Logic gates; Phase locked loops; Phase noise; TV; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Custom Integrated Circuits Conference (CICC), 2011 IEEE
Conference_Location :
San Jose, CA
ISSN :
0886-5930
Print_ISBN :
978-1-4577-0222-8
Type :
conf
DOI :
10.1109/CICC.2011.6055303
Filename :
6055303
Link To Document :
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