DocumentCode :
1964473
Title :
The benefits of a flux-free atmosphere for wafer bump reflow
Author :
LeMieux, Pierre ; Tong, Tiffany ; Brown, Kristen
Author_Institution :
BTU Int., North Billerica, MA, USA
fYear :
2003
fDate :
16-18 July 2003
Firstpage :
335
Lastpage :
337
Abstract :
There is constant pressure in semiconductor packaging to reduce costs while maintaining process yields. Wafer Level Packaging has increased in response to this pressure so that for the first time the packaging cost can remain constant despite the increasing number of die per wafer. The combination of shrinking pitch sizes and environmental regulations, causing materials changes, will make this even harder in the coming years. To keep costs down many wafer bump reflow processes use flux to reduce solder oxidation. However, the cost benefits of flux may not hold up when the total costs of the process are examined. We will examine using flux for wafer bump reflow including the impact on manufacturing and environmental considerations. The increased need for process cleanliness as it relates to flux and flux contamination will also be discussed. We will discuss alternatives to flux for oxide reduction. Specifically, Hydrogen atmosphere reflow will be examined including mechanism for oxide reduction and safety considerations. We will discuss the convergence of the needs for technology and cost reduction and form a conclusion on the best solutions to meet the needs of wafer bump reflow for leading technologists in the coming years.
Keywords :
reflow soldering; semiconductor device packaging; solders; wafer bonding; flux contamination; flux free atmosphere; hydrogen atmosphere reflow; oxide reduction; packaging cost; safety considerations; semiconductor packaging; shrinking pitch sizes; wafer bump reflow; wafer level packaging; Atmosphere; Contamination; Costs; Hydrogen; Manufacturing; Oxidation; Safety; Semiconductor device packaging; Semiconductor materials; Wafer scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Manufacturing Technology Symposium, 2003. IEMT 2003. IEEE/CPMT/SEMI 28th International
ISSN :
1089-8190
Print_ISBN :
0-7803-7933-0
Type :
conf
DOI :
10.1109/IEMT.2003.1225924
Filename :
1225924
Link To Document :
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