DocumentCode
1964969
Title
Preliminary results of the ORNL swept dual-frequency X-mode reflectometer for TFTR
Author
Collazo-Lopez, I. ; Hanson, G.R. ; Wilgen, J.B. ; Bigelow, T.S. ; Thomas, C.E. ; Nazikian, R. ; McCarthy, M. ; Mazzucato, E.
Author_Institution
Georgia Inst. of Technol., Atlanta, GA, USA
fYear
1993
fDate
7-9 June 1993
Firstpage
229
Abstract
Summary form only given. The edge density profile can play an important part in determining the plasma confinement and the coupling of ICRH power to the plasma. To study the effect of the ICRH power on the plasma, a swept dual-frequency reflectometer has been installed and tested on the TFTR (Tokamak Fusion Test Reactor). This reflectometer uses a dual-frequency differential phase measurement to reconstruct the edge density profile, with the advantage of reducing the fringe count and the errors due to fringe skipping. The X-mode of propagation is used because of its ability to probe the edge of the plasma starting at the local electron cyclotron resonance frequency with a minimum of frequency range and its inherently good spatial resolution at such low densities.
Keywords
plasma toroidal confinement; ICRH power; ORNL swept dual-frequency X-mode reflectometer; TFTR; Tokamak Fusion Test Reactor; X-mode of propagation; dual-frequency differential phase measurement; edge density profile; fringe count; fringe skipping; local electron cyclotron resonance frequency; plasma confinement; spatial resolution; Cyclotrons; Electrons; Inductors; Phase measurement; Plasma confinement; Plasma density; Plasma measurements; Probes; Testing; Tokamaks;
fLanguage
English
Publisher
ieee
Conference_Titel
Plasma Science, 1993. IEEE Conference Record - Abstracts., 1993 IEEE International Conference on
Conference_Location
Vancouver, BC, Canada
ISSN
0730-9244
Print_ISBN
0-7803-1360-7
Type
conf
DOI
10.1109/PLASMA.1993.593620
Filename
593620
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