DocumentCode :
1965069
Title :
Fault detection in multiple valued logic circuits
Author :
Damarla, T. Raju
Author_Institution :
Dept. of Electr. Eng., Kentucky Univ., Lexington, KY, USA
fYear :
1990
fDate :
23-25 May 1990
Firstpage :
69
Lastpage :
74
Abstract :
There are k=pn different canonical representations for a given multiple-valued-logic (MVL) function, where k is called the polarity, and p and n denote the radix and the number of variables of a function, respectively. The coefficients in a canonical representation are called spectral coefficients. Relationships between the functional values of a function and the spectral coefficients are given. A relation between the number of spectral coefficients that a fault may distort and the number of test patterns required to detect the fault is given. It is also shown that the test patterns can be generated systematically
Keywords :
logic testing; many-valued logics; canonical representation; fault detection; multiple valued logic circuits; spectral coefficients; test patterns; Circuit faults; Digital systems; Electrical fault detection; Fault detection; Logic design; Minimization; Multivalued logic; Signal processing algorithms; System testing; Test pattern generators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Multiple-Valued Logic, 1990., Proceedings of the Twentieth International Symposium on
Conference_Location :
Charlotte, NC
Print_ISBN :
0-8186-2046-3
Type :
conf
DOI :
10.1109/ISMVL.1990.122596
Filename :
122596
Link To Document :
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