DocumentCode
1965102
Title
Learning from Positive and Unlabeled Examples: A Survey
Author
Zhang, Bangzuo ; Zuo, Wanli
Author_Institution
Coll. of Comput. Sci. & Technol., Jilin Univ., Changchun
fYear
2008
fDate
23-25 May 2008
Firstpage
650
Lastpage
654
Abstract
This paper surveys the existing method of learning from positive and unlabeled examples. We divide the existing methods into three families, and review the main algorithms, respectively. The first Family of methods takes a two-step strategy, extracting some reliable negative examples, and then applying the supervised or semi-supervised learning method. The second family of methods estimates statistical queries over positive and unlabeled examples. The third family of methods reduces this problem to the problem of learning with high one-sided noise by treating the unlabeled set as noisy negative examples. Finally, we conclude and issue future works.
Keywords
learning (artificial intelligence); noisy negative examples; positive examples; semi-supervised learning method; statistical queries; two-step strategy; unlabeled examples; Bayesian methods; Classification algorithms; Computer science; Educational institutions; Information processing; Iterative algorithms; Niobium; Noise reduction; Semisupervised learning; Support vector machines; A Survey; Learning from Positive and Unlabeled examples; Semi-supervised Learning;
fLanguage
English
Publisher
ieee
Conference_Titel
Information Processing (ISIP), 2008 International Symposiums on
Conference_Location
Moscow
Print_ISBN
978-0-7695-3151-9
Type
conf
DOI
10.1109/ISIP.2008.79
Filename
4554167
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