• DocumentCode
    1965102
  • Title

    Learning from Positive and Unlabeled Examples: A Survey

  • Author

    Zhang, Bangzuo ; Zuo, Wanli

  • Author_Institution
    Coll. of Comput. Sci. & Technol., Jilin Univ., Changchun
  • fYear
    2008
  • fDate
    23-25 May 2008
  • Firstpage
    650
  • Lastpage
    654
  • Abstract
    This paper surveys the existing method of learning from positive and unlabeled examples. We divide the existing methods into three families, and review the main algorithms, respectively. The first Family of methods takes a two-step strategy, extracting some reliable negative examples, and then applying the supervised or semi-supervised learning method. The second family of methods estimates statistical queries over positive and unlabeled examples. The third family of methods reduces this problem to the problem of learning with high one-sided noise by treating the unlabeled set as noisy negative examples. Finally, we conclude and issue future works.
  • Keywords
    learning (artificial intelligence); noisy negative examples; positive examples; semi-supervised learning method; statistical queries; two-step strategy; unlabeled examples; Bayesian methods; Classification algorithms; Computer science; Educational institutions; Information processing; Iterative algorithms; Niobium; Noise reduction; Semisupervised learning; Support vector machines; A Survey; Learning from Positive and Unlabeled examples; Semi-supervised Learning;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Processing (ISIP), 2008 International Symposiums on
  • Conference_Location
    Moscow
  • Print_ISBN
    978-0-7695-3151-9
  • Type

    conf

  • DOI
    10.1109/ISIP.2008.79
  • Filename
    4554167