DocumentCode :
1965142
Title :
Area efficient phase calibration of a 1.6 GHz multiphase DLL
Author :
Agrawal, Ankur ; Hanumolu, Pavan Kumar ; Wei, Gu-Yeon
Author_Institution :
IBM Res., Yorktown Heights, NY, USA
fYear :
2011
fDate :
19-21 Sept. 2011
Firstpage :
1
Lastpage :
4
Abstract :
This paper describes a digital calibration scheme that corrects for phase spacing errors in a multiphase clock generating delay-locked loop (DLL). The calibration scheme employs sub-sampling using a frequency-offset clock with respect to the DLL reference clock, to measure phase-offsets. The phase-correction circuit uses one digital-to-analog converter across eight variable-delay buffers to reduce the area consumption by 62%. The test-chip, designed in a 130 nm CMOS process, demonstrates a 8-phase 1.6 GHz DLL with a worst-case phase error of 450 fs.
Keywords :
CMOS integrated circuits; calibration; clocks; delay lock loops; digital-analogue conversion; CMOS process; DLL reference clock; area efficient phase calibration; digital calibration scheme; digital-to-analog converter; frequency 1.6 GHz; frequency-offset clock; multiphase DLL; multiphase clock generating delay-locked loop; phase spacing errors; phase-correction circuit; phase-offsets; size 130 nm; test-chip; variable-delay buffers; worst-case phase error; Calibration; Clocks; Delay; Frequency measurement; Jitter; Phase measurement; Radiation detectors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Custom Integrated Circuits Conference (CICC), 2011 IEEE
Conference_Location :
San Jose, CA
ISSN :
0886-5930
Print_ISBN :
978-1-4577-0222-8
Type :
conf
DOI :
10.1109/CICC.2011.6055345
Filename :
6055345
Link To Document :
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