DocumentCode :
1965147
Title :
On the measurements in an electron cyclotron resonance plasma by the electric probes
Author :
Kim, Yun-Jung ; Kim, Jung-Ho ; Song, S.-K. ; Chang, Hong-Yeh
Author_Institution :
Dept. of Phys., KAIST, Taejon, South Korea
fYear :
1993
fDate :
7-9 June 1993
Firstpage :
229
Abstract :
Summary form only given, as follows. Plasma diagnostics in the reaction zone of an electron cyclotron resonance (ECR) plasma chemical vapor deposition (CVD) apparatus has been performed using fast injection Langmuir probes and ion energy analyzers. Further studies of the behavior of plasma parameters, i.e., electron temperature plasma density and ion energy due to the ambipolar potential were made according to pressure, magnetic field geometry, and the microwave input power. The pressure dependence can be explained in terms of an analytical model based on the experimental results. The effects of magnetic field geometry and gas pressure on the hot electron temperature have been experimentally examined. Whether the fast neutrals could be generated as a consequence of charge exchange collisions has been investigated.
Keywords :
plasma CVD; ambipolar potential; analytical model; charge exchange collisions; electric probes; electron cyclotron resonance plasma; electron temperature; fast injection Langmuir probes; ion energy; ion energy analyzers; magnetic field geometry; microwave input power; plasma chemical vapour deposition apparatus; plasma density; plasma diagnostics; plasma parameters; pressure; pressure dependence; reaction zone; Chemical vapor deposition; Cyclotrons; Electrons; Geometry; Magnetic resonance; Plasma chemistry; Plasma density; Plasma diagnostics; Plasma measurements; Plasma temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 1993. IEEE Conference Record - Abstracts., 1993 IEEE International Conference on
Conference_Location :
Vancouver, BC, Canada
ISSN :
0730-9244
Print_ISBN :
0-7803-1360-7
Type :
conf
DOI :
10.1109/PLASMA.1993.593621
Filename :
593621
Link To Document :
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