DocumentCode :
1965180
Title :
Hot Electrons Microwave Power Monitors for X and S-Bands
Author :
Konopka, J.
Author_Institution :
Instysut Fizyki PAN, Al. Lotnikow 32/44, 02-668 warszawa, POLAND
fYear :
1975
fDate :
1-4 Sept. 1975
Firstpage :
89
Lastpage :
94
Abstract :
Design and performance of very high pulse power monitors based on the thermoelectric effects of hot carriers in a semiconductor placed in the microwave electric field gradient is described. Principle of operation of the devices is presented with the special attention paid to semiconductor material choice and some particular design problems. The results of measurements of S and X-band power monitors are given up to 1 MW and 100 KW respectively. Thermoelectric voltage of hot carriers is not sensitive to ambient temperature changes from - 40 to + 60°C. No aging effects during 6 month period were detected.
Keywords :
Charge carrier processes; Distribution functions; Electrons; Hot carriers; Lattices; Power measurement; Power system reliability; Probes; Semiconductor waveguides; Temperature distribution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference, 1975. 5th European
Conference_Location :
Hamburg, Germany
Type :
conf
DOI :
10.1109/EUMA.1975.332159
Filename :
4130788
Link To Document :
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