Title :
A Pseudo-Boolean Technique for Generating Compact Transition Tests with All-Output-Propagation Properties
Author :
Iwagaki, Tsuyoshi ; Kaneko, Mineo
Author_Institution :
Sch. of Inf. Sci., Japan Adv. Inst. of Sci. & Technol. (JAIST), Nomi, Japan
Abstract :
This paper presents a technique for deriving a test set that detects each transition fault at all the reachable outputs from the fault site. It is known that such tests, which are called all-output-propagation (AOP) ones, can enhance the detectability of un-modeled defects. In order to generate compact AOP tests, pseudo-Boolean (0-1 integer programming) model is introduced in this paper. Moreover, a simple and reasonable heuristic way is also introduced to reduce the size of AOP tests efficiently.It is shown that the proposed method can generate compact AOP tests in a reasonable amount of test generation time through some experiments.
Keywords :
Boolean functions; automatic test pattern generation; fault diagnosis; integer programming; 0-1 integer programming; all-output-propagation test; defect detection; pseudo-Boolean model; test generation time; test set reduction; transition faults; transition tests; Electronic equipment testing; all-output-propagation (AOP); pseudo-Boolean model; test set reduction; transition fault;
Conference_Titel :
Electronic Design, Test and Application, 2010. DELTA '10. Fifth IEEE International Symposium on
Conference_Location :
Ho Chi Minh City
Print_ISBN :
978-0-7695-3978-2
Electronic_ISBN :
978-1-4244-6026-7
DOI :
10.1109/DELTA.2010.58