DocumentCode
1965396
Title
Three Dimensional integration - Considerations for memory applications
Author
Iyer, S.S. ; Kirihata, T. ; Barth, J.E.
Author_Institution
IBM Syst. & Technol. Group, Hopewell Junction, NY, USA
fYear
2011
fDate
19-21 Sept. 2011
Firstpage
1
Lastpage
7
Abstract
This paper reviews the technology and design considerations for the implementation of 3 Dimensional integration of memory in a high performance logic environment.
Keywords
SRAM chips; integration; logic design; high performance logic environment; memory applications; three dimensional integration; Assembly; Copper; Integrated circuit interconnections; Laminates; Three dimensional displays; Through-silicon vias; Wiring; 3D EDA; 3D integration; TSVs; embedded memory;
fLanguage
English
Publisher
ieee
Conference_Titel
Custom Integrated Circuits Conference (CICC), 2011 IEEE
Conference_Location
San Jose, CA
ISSN
0886-5930
Print_ISBN
978-1-4577-0222-8
Type
conf
DOI
10.1109/CICC.2011.6055356
Filename
6055356
Link To Document