Title :
DRAM-on-logic Stack – Calibrated thermal and mechanical models integrated into PathFinding flow
Author :
Milojevic, Dragomir ; Oprins, Herman ; Ryckaert, Julien ; Marchal, Paul ; Van der Plas, Geert
Author_Institution :
IMEC, Leuven, Belgium
Abstract :
In this paper, we present thermal and mechanical characterization of a DRAM-on-logic stack. Our experimental data indicates that a holistic optimization of design and technology is needed to achieve working 3D stacks. Particularly, the stack organization and TSV/μbump layout must be fine-tuned together with the 3D technology for managing mechanical and thermal challenges. In order to support system designers, we propose hereto a dedicated thermal and mechanical model, integrated into the design flow. We also indicate the data required from foundries and OSATs to achieve good fidelity with measurement results.
Keywords :
DRAM chips; calibration; logic circuits; three-dimensional integrated circuits; DRAM-on-logic stack; OSAT; TSV-μbump layout; calibration; fine-tuned together; holistic optimization; mechanical characterization; pathfinding flow; support system designer; thermal characterization; working 3D stack; Materials; Performance evaluation; Random access memory; Stress; Temperature measurement; Three dimensional displays; Through-silicon vias; 3D; Characterization; Design flow;
Conference_Titel :
Custom Integrated Circuits Conference (CICC), 2011 IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4577-0222-8
DOI :
10.1109/CICC.2011.6055357