• DocumentCode
    1965414
  • Title

    DRAM-on-logic Stack – Calibrated thermal and mechanical models integrated into PathFinding flow

  • Author

    Milojevic, Dragomir ; Oprins, Herman ; Ryckaert, Julien ; Marchal, Paul ; Van der Plas, Geert

  • Author_Institution
    IMEC, Leuven, Belgium
  • fYear
    2011
  • fDate
    19-21 Sept. 2011
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this paper, we present thermal and mechanical characterization of a DRAM-on-logic stack. Our experimental data indicates that a holistic optimization of design and technology is needed to achieve working 3D stacks. Particularly, the stack organization and TSV/μbump layout must be fine-tuned together with the 3D technology for managing mechanical and thermal challenges. In order to support system designers, we propose hereto a dedicated thermal and mechanical model, integrated into the design flow. We also indicate the data required from foundries and OSATs to achieve good fidelity with measurement results.
  • Keywords
    DRAM chips; calibration; logic circuits; three-dimensional integrated circuits; DRAM-on-logic stack; OSAT; TSV-μbump layout; calibration; fine-tuned together; holistic optimization; mechanical characterization; pathfinding flow; support system designer; thermal characterization; working 3D stack; Materials; Performance evaluation; Random access memory; Stress; Temperature measurement; Three dimensional displays; Through-silicon vias; 3D; Characterization; Design flow;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference (CICC), 2011 IEEE
  • Conference_Location
    San Jose, CA
  • ISSN
    0886-5930
  • Print_ISBN
    978-1-4577-0222-8
  • Type

    conf

  • DOI
    10.1109/CICC.2011.6055357
  • Filename
    6055357