• DocumentCode
    1965490
  • Title

    Microwave Scanning Microscopy for Non-Destructive Testing

  • Author

    Husain, A. ; Ash, E.A.

  • Author_Institution
    Department of Electronic and Electrical Engineering, University College London, Torrington Place, London, WC1E 7JE.
  • fYear
    1975
  • fDate
    1-4 Sept. 1975
  • Firstpage
    213
  • Lastpage
    217
  • Abstract
    A microwave scanning microscope capable of detecting and locating defects in a metal surface is described. Using a technique to obtain super-resolution, previously described, the instrument has proved capable of resolving gratings with periods of ¿/200, and of detecting fatigue cracks less than 2¿ in width.
  • Keywords
    Apertures; Ash; Frequency; Gratings; Instruments; Microscopy; Nondestructive testing; Signal processing; Signal resolution; Surface cracks;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 1975. 5th European
  • Conference_Location
    Hamburg, Germany
  • Type

    conf

  • DOI
    10.1109/EUMA.1975.332181
  • Filename
    4130810
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1965490