Title :
Microwave Scanning Microscopy for Non-Destructive Testing
Author :
Husain, A. ; Ash, E.A.
Author_Institution :
Department of Electronic and Electrical Engineering, University College London, Torrington Place, London, WC1E 7JE.
Abstract :
A microwave scanning microscope capable of detecting and locating defects in a metal surface is described. Using a technique to obtain super-resolution, previously described, the instrument has proved capable of resolving gratings with periods of ¿/200, and of detecting fatigue cracks less than 2¿ in width.
Keywords :
Apertures; Ash; Frequency; Gratings; Instruments; Microscopy; Nondestructive testing; Signal processing; Signal resolution; Surface cracks;
Conference_Titel :
Microwave Conference, 1975. 5th European
Conference_Location :
Hamburg, Germany
DOI :
10.1109/EUMA.1975.332181
