DocumentCode :
1965523
Title :
Effect of long-scale roughness in light scattering from slightly rough dielectric layers
Author :
Kaganovskii, Yu.S. ; Freilikher, V.D. ; Rosenbluh, M.
Author_Institution :
Dept. of Phys., Bar-Ilan Univ., Ramat-Gan, Israel
fYear :
1998
fDate :
8-8 May 1998
Firstpage :
179
Lastpage :
180
Abstract :
Summary form only given.Scattering of light from slightly rough, thin, dielectric films is a classic optics problem, with a long and prestigious history. In spite of the seeming simplicity of the problem, however, and the vast literature covering the topic, no proper theoretical description or clear physical understanding exists of many of the experimental features, some of which we present here. Coherent light scattered from a slightly rough dielectric layer consists of speckle spots that arrange themselves into concentric interference rings centered around the normal to the scattering surface. In this paper, we show that the long-scale (smooth) component of the roughness spectrum (LSR) is responsible for determining the ring positions and their dependence on incidence and scattering angle, even though the presence of the interference rings is made possible mostly by the light scattered by the small-scale roughness (SSR).
Keywords :
light coherence; light scattering; optical films; rough surfaces; classic optics problem; coherent light scattering; concentric interference rings; incidence angle; light scattering; long-scale roughness; long-scale smooth component; physical understanding; prestigious history; ring positions; roughness spectrum; scattering angle; scattering surface; slightly rough dielectric layers; slightly rough thin dielectric films; small-scale roughness; speckle spots; Adaptive optics; Dielectric films; History; Interference; Light scattering; Optical films; Optical scattering; Rough surfaces; Speckle; Surface roughness;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quantum Electronics Conference, 1998. IQEC 98. Technical Digest. Summaries of papers presented at the International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
1-55752-541-2
Type :
conf
DOI :
10.1109/IQEC.1998.680360
Filename :
680360
Link To Document :
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