Title :
Modeling of Probabilistic Ripple-Carry Adders
Author :
Lau, Mark S K ; Ling, Keck Voon ; Chu, Yun Chung ; Bhanu, Arun
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
Abstract :
This paper proposes a mathematical model for probabilistic ripple-carry adders. The model gives explicit expressions for calculating error probabilities of sum and carry bits. The expressions show how errors propagate through the carry, which accumulate and eventually influence the correctness of a ripple-carry adder´s outputs. The proposed model is flexible since it only requires mild assumptions on the probability distribution of noise. Hence, in addition to Gaussian, it is applicable to a wide class of distributions. We validate the model through HSPICE simulation. The model is able to predict error-rates of a simulated probabilistic ripple-carry adder with reasonable accuracy.
Keywords :
adders; integrated circuit modelling; probability; HSPICE simulation; error probability; error propagation; noise modelling; probabilistic ripple-carry adders; Adders; Birth disorders; Computational modeling; Energy consumption; Error probability; Mathematical model; Predictive models; Probability distribution; Switches; Voltage; Probabilistic computation; error propagation; noies modeling; ripple-carry adder;
Conference_Titel :
Electronic Design, Test and Application, 2010. DELTA '10. Fifth IEEE International Symposium on
Conference_Location :
Ho Chi Minh City
Print_ISBN :
978-0-7695-3978-2
Electronic_ISBN :
978-1-4244-6026-7
DOI :
10.1109/DELTA.2010.14