DocumentCode :
1965697
Title :
A 0.66erms temporal-readout-noise 3D-stacked CMOS image sensor with conditional correlated multiple sampling (CCMS) technique
Author :
Shang-Fu Yeh ; Kuo-Yu Chou ; Hon-Yih Tu ; Chao, Calvin Yi-Ping ; Fu-Lung Hsueh
Author_Institution :
Taiwan Semicond. Manuf. Co., Hsinchu, Taiwan
fYear :
2015
fDate :
17-19 June 2015
Abstract :
A conditional correlated multiple sampling (CCMS) technique for low noise CMOS image sensor (CIS) is proposed to reduce noise and address low frame rate issue caused by the conventional correlated multiple sampling (CMS) technique. An 8Mpixel 3D-stacked CIS with 1.1um pixel pitch is designed and verified. Measurement results show this technique can achieve 0.66e-rms at 36.1 kHz A/D sampling rate per pixel with analog gain at 16 and 5-times multiple sampling. The resulting DNL is within -0.49/+0.45LSB.
Keywords :
CMOS image sensors; readout electronics; analog gain; conditional correlated multiple sampling technique; low frame rate issue; temporal-readout-noise 3D-stacked CMOS image sensor; CMOS image sensors; Gain measurement; Indexes; Latches; Noise; Photonics; Radiation detectors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Circuits (VLSI Circuits), 2015 Symposium on
Conference_Location :
Kyoto
Print_ISBN :
978-4-86348-502-0
Type :
conf
DOI :
10.1109/VLSIC.2015.7231332
Filename :
7231332
Link To Document :
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