Title : 
A 0.66e−rms temporal-readout-noise 3D-stacked CMOS image sensor with conditional correlated multiple sampling (CCMS) technique
         
        
            Author : 
Shang-Fu Yeh ; Kuo-Yu Chou ; Hon-Yih Tu ; Chao, Calvin Yi-Ping ; Fu-Lung Hsueh
         
        
            Author_Institution : 
Taiwan Semicond. Manuf. Co., Hsinchu, Taiwan
         
        
        
        
            Abstract : 
A conditional correlated multiple sampling (CCMS) technique for low noise CMOS image sensor (CIS) is proposed to reduce noise and address low frame rate issue caused by the conventional correlated multiple sampling (CMS) technique. An 8Mpixel 3D-stacked CIS with 1.1um pixel pitch is designed and verified. Measurement results show this technique can achieve 0.66e-rms at 36.1 kHz A/D sampling rate per pixel with analog gain at 16 and 5-times multiple sampling. The resulting DNL is within -0.49/+0.45LSB.
         
        
            Keywords : 
CMOS image sensors; readout electronics; analog gain; conditional correlated multiple sampling technique; low frame rate issue; temporal-readout-noise 3D-stacked CMOS image sensor; CMOS image sensors; Gain measurement; Indexes; Latches; Noise; Photonics; Radiation detectors;
         
        
        
        
            Conference_Titel : 
VLSI Circuits (VLSI Circuits), 2015 Symposium on
         
        
            Conference_Location : 
Kyoto
         
        
            Print_ISBN : 
978-4-86348-502-0
         
        
        
            DOI : 
10.1109/VLSIC.2015.7231332