Title :
An Exact and Efficient Critical Path Tracing Algorithm
Author :
Bosio, A. ; Girard, P. ; Pravossoudovitch, S. ; Bernardi, P. ; Reorda, M. Sonza
Author_Institution :
Lab. d´´Inf., de Robot. et de Microelectron. de Montpellier, Univ. Montpellier II, Montpellier, France
Abstract :
This paper presents an exact and efficient Critical Path Tracing algorithm targeting fault simulation of both Transition and Stuck-at faults. The complexity of the proposed algorithm is linear in the number of gates traced during the path tracing process. Experimental results show the efficiency of the proposed approach on a set of benchmark circuits.
Keywords :
fault simulation; logic testing; efficient critical path tracing algorithm; fault simulation; stuck-at faults; transition faults; Algebra; Algorithm design and analysis; Circuit faults; Circuit simulation; Electronic equipment testing; Fault detection; Libraries; Logic functions; Logic gates; Robots; Critical Path Tracing; Fault Simulation; Fault models;
Conference_Titel :
Electronic Design, Test and Application, 2010. DELTA '10. Fifth IEEE International Symposium on
Conference_Location :
Ho Chi Minh City
Print_ISBN :
978-0-7695-3978-2
Electronic_ISBN :
978-1-4244-6026-7
DOI :
10.1109/DELTA.2010.35
