• DocumentCode
    1965878
  • Title

    All-digital 3-50 GHz ultra-wideband pulse generator for short-range wireless interconnect in 40nm CMOS

  • Author

    Hu, Changhui ; Chiang, Patrick Y.

  • Author_Institution
    Marvell Technol., Santa Clara, CA, USA
  • fYear
    2011
  • fDate
    19-21 Sept. 2011
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    A reconfigurable, 3-50GHz all-digital impulse generator for short-distance wireless communications is designed in 40nm-CMOS. Digital back-gate biasing is used for raised-cosine envelope pulse-shaping to achieve better spectral-mask efficiency. Pulse duration, duty-cycle, and operating frequency are digitally programmable, in order to satisfy multi-band standards compatibility. An asymmetric inverter design within the Mono-Pulse-Generator (MPG) eliminates undesired glitches for the complementary clock edge. Occupying 350μm×260μm die area, the proposed impulse transmitter achieves a maximum data-rate of 3Gbps and an energy-efficiency of 0.5pJ/pulse for a 25GHz carrier frequency.
  • Keywords
    CMOS integrated circuits; clocks; invertors; microwave devices; millimetre wave devices; pulse generators; pulse shaping circuits; radio transmitters; ultra wideband communication; CMOS process; MPG; all-digital impulse generator; all-digital ultrawideband pulse generator; asymmetric inverter design; bit rate 3 Gbit/s; complementary clock edge; digital back-gate biasing; energy-efficiency; frequency 3 GHz to 50 GHz; impulse transmitter; monopulse-generator; multiband standard compatibility; pulse duration duty-cycle operating frequency; raised-cosine envelope pulse-shaping; short-range wireless interconnection; size 40 nm; spectral-mask efficiency; CMOS integrated circuits; Delay; Frequency measurement; Inverters; Pulse generation; Pulse measurements; Wireless communication; Impulse radio (IR); UWB; all digital; asymmetric inverter; pulse generator; transmitter;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference (CICC), 2011 IEEE
  • Conference_Location
    San Jose, CA
  • ISSN
    0886-5930
  • Print_ISBN
    978-1-4577-0222-8
  • Type

    conf

  • DOI
    10.1109/CICC.2011.6055382
  • Filename
    6055382