DocumentCode :
1966106
Title :
A use of Bayes' theorem for insight of false alarm rates
Author :
Allen, Duane
Author_Institution :
Naval Surface Warfare Center, Corona
fYear :
2007
fDate :
17-20 Sept. 2007
Firstpage :
34
Lastpage :
39
Abstract :
Using Bayes´ theorem, the false alarm rate is shown to be a function of the reliability of the monitored functional system, the reliability of the built-in-test (BIT) system, and the coverage by the BIT of the monitored functional system. Partial differentiation of the false alarm rate formula reveals that the false alarm rate varies inversely with BIT reliability, inversely with BIT coverage, and directly with the monitored functional system reliability. Improving a functional system´s reliability increases the false alarm rate, even though there is no change in the frequency of false alarm events. Therefore a false alarm rate requirement may deter functional circuit design improvement. This paper advocates categorizing the sources of false alarm events in a system since false alarms rates can sometimes be relatively high due to the complexity of an adequate BIT.
Keywords :
Bayes methods; built-in self test; differentiation; BIT reliability; Bayes theorem; built-in-test system; false alarm rates; monitored functional system; partial differentiation; Circuit synthesis; Condition monitoring; Corona; Frequency; IEEE members; Measurement uncertainty; Military aircraft; Reliability theory; Testing; Transfer functions;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Autotestcon, 2007 IEEE
Conference_Location :
Baltimore, MD
ISSN :
1088-7725
Print_ISBN :
978-1-4244-1239-6
Electronic_ISBN :
1088-7725
Type :
conf
DOI :
10.1109/AUTEST.2007.4374199
Filename :
4374199
Link To Document :
بازگشت