Automated test program generation for an industrial optimizing compiler

Author

Zhao, Chen ; Xue, Yunzhi ; Tao, Qiuming ; Guo, Liang ; Wang, Zhaohui

Author_Institution

Inst. of Software, Chinese Acad. of Sci., Beijing

fYear

2009

fDate

18-19 May 2009

Firstpage

36

Lastpage

43

Abstract

This paper presents joint research and practice on automated test program generation for an industrial compiler, UniPhier, by Matsushita Electric Industrial Co., Ltd. (MEI) and Institute of Software, Chinese Academy of Sciences (ISCAS) since Sept. 2002. To meet the test requirements of MEI´s engineers, we proposed an automated approach to produce test programs for UniPhier, and as a result we developed an integrated tool named JTT. Firstly, we show the script-driven test program generation process in JTT. Secondly, we show how to produce test programs automatically, based on a temporal-logic model of compiler optimizations, to guarantee the execution of optimizing modules under test during compilation. JTT has gained success in testing UniPhier: even after benchmark testing and comprehensive manual testing, JTT still found 6 new serious defects.

Keywords

automatic programming; optimising compilers; program testing; temporal logic; Chinese Academy of Sciences; Institute of Software; Matsushita Electric Industrial Co., Ltd; automated test program generation; industrial optimizing compiler; script-driven test program generation process; temporal-logic model; Automatic testing; Benchmark testing; Character generation; Computer industry; High level synthesis; Logic testing; Multilevel systems; Optimizing compilers; Program processors; Software testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Automation of Software Test, 2009. AST '09. ICSE Workshop on

Conference_Location

Vancouver, BC

Print_ISBN

978-1-4244-3711-5

Type

conf

DOI

10.1109/IWAST.2009.5069039

Filename

5069039