DocumentCode :
1966202
Title :
Automated test program generation for an industrial optimizing compiler
Author :
Zhao, Chen ; Xue, Yunzhi ; Tao, Qiuming ; Guo, Liang ; Wang, Zhaohui
Author_Institution :
Inst. of Software, Chinese Acad. of Sci., Beijing
fYear :
2009
fDate :
18-19 May 2009
Firstpage :
36
Lastpage :
43
Abstract :
This paper presents joint research and practice on automated test program generation for an industrial compiler, UniPhier, by Matsushita Electric Industrial Co., Ltd. (MEI) and Institute of Software, Chinese Academy of Sciences (ISCAS) since Sept. 2002. To meet the test requirements of MEI´s engineers, we proposed an automated approach to produce test programs for UniPhier, and as a result we developed an integrated tool named JTT. Firstly, we show the script-driven test program generation process in JTT. Secondly, we show how to produce test programs automatically, based on a temporal-logic model of compiler optimizations, to guarantee the execution of optimizing modules under test during compilation. JTT has gained success in testing UniPhier: even after benchmark testing and comprehensive manual testing, JTT still found 6 new serious defects.
Keywords :
automatic programming; optimising compilers; program testing; temporal logic; Chinese Academy of Sciences; Institute of Software; Matsushita Electric Industrial Co., Ltd; automated test program generation; industrial optimizing compiler; script-driven test program generation process; temporal-logic model; Automatic testing; Benchmark testing; Character generation; Computer industry; High level synthesis; Logic testing; Multilevel systems; Optimizing compilers; Program processors; Software testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Automation of Software Test, 2009. AST '09. ICSE Workshop on
Conference_Location :
Vancouver, BC
Print_ISBN :
978-1-4244-3711-5
Type :
conf
DOI :
10.1109/IWAST.2009.5069039
Filename :
5069039
Link To Document :
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