Title :
An inexpensive microelectronic environmental test chamber
Author :
Sloat, Jacob D. ; Geiger, Randall L.
Author_Institution :
Dept. of Electr. & Comput. Eng., Iowa State Univ., Ames, IA
Abstract :
An inexpensive microelectronic environmental test chamber design is proposed that can vary the temperature with a range of greater than 10degC to 90degC. The chamber is capable of automating temperature cycling as well as automating the electronic measurements taken. Driven by thermoelectric devices, the chamber is exceptionally space efficient and flexible in use; occupying an area of less than 1.5 cubic feet and powered by a standard wall outlet. The total cost of such a unit is less than a fraction of the average cost of a typical industrial built unit.
Keywords :
integrated circuit testing; thermoelectric devices; microelectronic environmental test chamber; temperature cycling; thermoelectric devices; Cooling; Costs; Electronic equipment testing; Heat pumps; Heating; Microelectronics; Temperature; Thermoelectric devices; Thermoelectricity; Voltage; Environmental Test Chamber; Temperature Testing; Thermoelectric Coolers;
Conference_Titel :
Electro/Information Technology, 2008. EIT 2008. IEEE International Conference on
Conference_Location :
Ames, IA
Print_ISBN :
978-1-4244-2029-2
Electronic_ISBN :
978-1-4244-2030-8
DOI :
10.1109/EIT.2008.4554288
