• DocumentCode
    1966389
  • Title

    ATML as a framework for reducing development time and maintenance of next generation test systems

  • Author

    Delgado, Santiago ; Jain, Anand

  • Author_Institution
    Nat. Instrum., Austin
  • fYear
    2007
  • fDate
    17-20 Sept. 2007
  • Firstpage
    174
  • Lastpage
    177
  • Abstract
    Although ATML has started to gain momentum in the defense industry because of its adoption in high-profile projects (Woodward and Harris, 2006) and its implementation by ATS vendors (Gonzalez, 2006), a large segment of the automatic test community lacks in-depth knowledge of all the ATML components and how to use ATML in their own systems. Furthermore, for ATML to deliver on the productivity gains it proposes, ATML must be adopted beyond the defense industry. This article is an introduction to ATML, its subcomponents, and how it is being used in automatic test software development. In particular, this article focuses on how ATML can facilitate information exchange, expand interoperability of test systems, and increase ATS component documentation. The article describes the eight schemas that make up ATML and focuses on the test description and test results schemas to demonstrate how ATSs can use these components.
  • Keywords
    automatic test software; military computing; software maintenance; ATML; automatic test markup language; automatic test software development; component documentation; defense industry; gain momentum; generation test system maintenance; information exchange; test description; Aerospace testing; Automatic testing; Costs; Defense industry; Documentation; Instruments; Productivity; Software testing; System testing; XML;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Autotestcon, 2007 IEEE
  • Conference_Location
    Baltimore, MD
  • ISSN
    1088-7725
  • Print_ISBN
    978-1-4244-1239-6
  • Electronic_ISBN
    1088-7725
  • Type

    conf

  • DOI
    10.1109/AUTEST.2007.4374217
  • Filename
    4374217