DocumentCode
1966389
Title
ATML as a framework for reducing development time and maintenance of next generation test systems
Author
Delgado, Santiago ; Jain, Anand
Author_Institution
Nat. Instrum., Austin
fYear
2007
fDate
17-20 Sept. 2007
Firstpage
174
Lastpage
177
Abstract
Although ATML has started to gain momentum in the defense industry because of its adoption in high-profile projects (Woodward and Harris, 2006) and its implementation by ATS vendors (Gonzalez, 2006), a large segment of the automatic test community lacks in-depth knowledge of all the ATML components and how to use ATML in their own systems. Furthermore, for ATML to deliver on the productivity gains it proposes, ATML must be adopted beyond the defense industry. This article is an introduction to ATML, its subcomponents, and how it is being used in automatic test software development. In particular, this article focuses on how ATML can facilitate information exchange, expand interoperability of test systems, and increase ATS component documentation. The article describes the eight schemas that make up ATML and focuses on the test description and test results schemas to demonstrate how ATSs can use these components.
Keywords
automatic test software; military computing; software maintenance; ATML; automatic test markup language; automatic test software development; component documentation; defense industry; gain momentum; generation test system maintenance; information exchange; test description; Aerospace testing; Automatic testing; Costs; Defense industry; Documentation; Instruments; Productivity; Software testing; System testing; XML;
fLanguage
English
Publisher
ieee
Conference_Titel
Autotestcon, 2007 IEEE
Conference_Location
Baltimore, MD
ISSN
1088-7725
Print_ISBN
978-1-4244-1239-6
Electronic_ISBN
1088-7725
Type
conf
DOI
10.1109/AUTEST.2007.4374217
Filename
4374217
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