DocumentCode :
1966401
Title :
ATML capabilities explained
Author :
Gorringe, Chris ; Lopes, Teresa ; Pleasant, Dan
Author_Institution :
EADS Test & Services (UK) Ltd., Wimborne
fYear :
2007
fDate :
17-20 Sept. 2007
Firstpage :
178
Lastpage :
189
Abstract :
This paper describes the major concepts of ATML Capabilities and how they are used to describe instrument performance and capabilities, using simple examples and use cases. The paper leads the user through a simple set of increasingly complex problems, at each step describing instrument and test system capabilities in a standard and reusable manner. The paper takes the form of a tutorial, posing and solving increasingly complex instrument description capabilities, with each step clearly explained and defined. Each step concentrates on a particular feature of the ATML capability standard, and each step shows how real world complex systems can be described though a methodical and consistent process. Finally the paper considers the impact that ATML capabilities could have on the test industry as a whole, and offers some real and tangible benefits that may be achieved by the adoption of ATML capabilities by the industry as a whole.
Keywords :
automatic test software; programming languages; ATML; automatic test mark up language; complex systems; instrument capabilities; instrument performance; test industry; Automatic testing; Instruments; Manufacturing industries; Resource management; Runtime; Signal generators; Signal mapping; Software testing; System testing; XML;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Autotestcon, 2007 IEEE
Conference_Location :
Baltimore, MD
ISSN :
1088-7725
Print_ISBN :
978-1-4244-1239-6
Electronic_ISBN :
1088-7725
Type :
conf
DOI :
10.1109/AUTEST.2007.4374218
Filename :
4374218
Link To Document :
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