Title :
Applications of IEEE P1671.1 ATML test description
Author :
Neag, Ion A. ; Seavey, Mike
Author_Institution :
Reston Software, Reston
Abstract :
The emerging ATML test description standard (IEEE P1671.1) defines an XML-based format for describing automated test programs. This paper contains an overview of the ATML test description format, provides insight into its design, and suggests a number of applications that have the potential to improve development and maintenance processes for automated test programs.
Keywords :
IEEE standards; XML; automatic test software; ATML test description; IEEE P1671.1; XML-based format; automated test programs; development process; maintenance process; Aerospace testing; Application software; Automatic testing; Computer languages; Documentation; Electronic equipment testing; Signal processing; Software testing; System testing; XML;
Conference_Titel :
Autotestcon, 2007 IEEE
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-4244-1239-6
Electronic_ISBN :
1088-7725
DOI :
10.1109/AUTEST.2007.4374220
