DocumentCode
1966522
Title
On-chip inductance modeling of VLSI interconnects
Author
Xiaoning Qi ; Kleveland, B. ; Zhiping Yu ; Wong, S. ; Dutton, R. ; Young, T.
Author_Institution
Center for Integrated Syst., Stanford Univ., CA, USA
fYear
2000
fDate
9-9 Feb. 2000
Firstpage
172
Lastpage
173
Abstract
At gigahertz frequencies, long interconnect wires exhibit transmission line behavior. Using copper and wider wires for major signal and power/ground lines, inductive impedance (j/spl omega/L) could become comparable to the resistive component of the wire (R). Due to the inductance, delay increases, over-shoot occurs, and inductive crosstalk can no longer be ignored. Inductive effects were recently demonstrated in 4 mm-long lines in a 0.25 /spl mu/m process. The extracted delays of a typical clock line from this test chip are shown. While the delay is a linear function of line length, the RC delay increases with the square of the line length. As a result, the inductive effects are actually more prominent for lines with intermediate lengths. The inductive effects for the intermediate length buses as well as local clocks must be considered. As technology is scaled, the gate delay time will continue to be reduced while the delay of short, low-resistive clock lines will remain constant. The inductive effects will therefore become prominent for progressively short lines. The article shows simulated inductance effects on crosstalk. Larger coupling and ringing effects are observed when inductive coupling is included in the simulation. Currently, the inductive effects are only considered for a few global clocks and buses, which is insufficient for future designs. Although 3D electromagnetic full wave solvers are available, they cannot manage the complexity of today´s integrated circuits. To model the inductive effects of intermediate-length buses as well as local clocks, a fast automated inductance extraction and verification tool is necessary.
Keywords
VLSI; crosstalk; delays; inductance; integrated circuit interconnections; integrated circuit modelling; wiring; 3 to 8 mm; RC delay; VLSI interconnects; gigahertz frequencies; inductance extraction; inductance verification tool; inductive coupling; inductive crosstalk; inductive impedance; interconnect wires; linear function; local clocks; low-resistive clock lines; on-chip inductance modeling; power/ground lines; resistive component; ringing effects; transmission line behavior; Clocks; Coupling circuits; Crosstalk; Delay effects; Frequency; Inductance; Integrated circuit interconnections; Power transmission lines; Very large scale integration; Wires;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference, 2000. Digest of Technical Papers. ISSCC. 2000 IEEE International
Conference_Location
San Francisco, CA, USA
ISSN
0193-6530
Print_ISBN
0-7803-5853-8
Type
conf
DOI
10.1109/ISSCC.2000.839736
Filename
839736
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