• DocumentCode
    1966530
  • Title

    Hierarchical plug-and-play self-diagnosable intelligent sensor networks for process control

  • Author

    Joshi, Bharat ; Vincent, Tyrone ; Chen, Jinran ; Somani, Arun ; Gomez, Nicholas ; Mitra, Reshmi

  • Author_Institution
    Dept. of Electr. & Comput. Eng., North Carolina Univ., Charlotte, NC
  • fYear
    2008
  • fDate
    18-20 May 2008
  • Firstpage
    246
  • Lastpage
    249
  • Abstract
    The focus of this research was to design a framework to create highly autonomous fault-tolerant distributed sensor networks with plug-and-play capabilities. This would enable diagnosis of faulty sensors and reconfiguration of the network in real time to ensure that the control of the manufacturing process can continue with accurate information in presence of sensor and processing element faults. The strategy is based on the recently approved IEEE 1451 family of standards. The innovative feature of the proposed effort is the IEEE 1451-based plug-and-play architecture that could lead to the development of a new member in the IEEE 1451 family of standards that will address reliability issues of the sensor networks.
  • Keywords
    IEEE standards; distributed sensors; fault diagnosis; fault tolerance; intelligent networks; intelligent sensors; manufacturing processes; process control; IEEE 1451 standard; autonomous fault-tolerant distributed sensor network; fault reconfiguration network; fault sensor diagnosis; hierarchical plug-and-play self-diagnosis; intelligent sensor network; Chemical sensors; Electrical equipment industry; Fault detection; Fault diagnosis; Fault tolerance; Intelligent sensors; Manufacturing processes; Process control; Sensor systems; Sputtering; IEEE 1451 family of standards; fault detection; fault diagnosis; fault-tolerance; intelligent sensor networks; process control; reliability; self-diagnosable; smart sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electro/Information Technology, 2008. EIT 2008. IEEE International Conference on
  • Conference_Location
    Ames, IA
  • Print_ISBN
    978-1-4244-2029-2
  • Electronic_ISBN
    978-1-4244-2030-8
  • Type

    conf

  • DOI
    10.1109/EIT.2008.4554306
  • Filename
    4554306