DocumentCode :
1966694
Title :
Vapor HF sacrificial etching for phosphorus doped polycrystalline silicon membrane structures
Author :
Cao, Haibo ; Weber, Robert J.
Author_Institution :
Dept. of Electr. & Comput. Eng., Iowa State Univ., Ames, IA
fYear :
2008
fDate :
18-20 May 2008
Firstpage :
289
Lastpage :
293
Abstract :
In this work we present a technique using HF vapor to release phosphorus doped polycrystalline silicon (Phos-Poly) circular membrane structures. A 2 um thick annealed phosphosilicate glass (PSG) has been used as the sacrificial layer. The sacrificial etching was followed by solvent rinses and Critical Point Drying (CPD) to remove any residual HF and to avoid sticition. A Phos-Poly diaphragm with a diameter of 106 um has been successfully released as well as some membrane arrays. This technique has been proved very simple and effective. The membrane structures can be used in pressure sensing applications.
Keywords :
annealing; elemental semiconductors; etching; microsensors; phosphorus; phosphosilicate glasses; pressure sensors; silicon; solvent effects; P2O5-SiO2; Phos-Poly diaphragm; Si:P; annealing; critical point drying; phosphorus doped polycrystalline silicon membrane structures; phosphosilicate glass; pressure sensing applications; size 106 mum; size 2 mum; solvent effect; vapor HF sacrificial etching; Annealing; Biomembranes; Electrodes; Etching; Glass; Hafnium; Mechanical factors; Mechanical sensors; Micromechanical devices; Silicon; HF Vapor; MEMS; pressure sensor; sacrificial etching;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electro/Information Technology, 2008. EIT 2008. IEEE International Conference on
Conference_Location :
Ames, IA
Print_ISBN :
978-1-4244-2029-2
Electronic_ISBN :
978-1-4244-2030-8
Type :
conf
DOI :
10.1109/EIT.2008.4554316
Filename :
4554316
Link To Document :
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