DocumentCode
1966929
Title
Unsupervised defect detection of flexible printed circuit board gold surfaces based on wavelet packet frame
Author
Wang, Qingxiang ; Li, Di ; Zhang, Wujie ; Cao, Dong ; Chen, Hao
Author_Institution
Sch. of Mech. & Automotive Eng., South China Univ. of Technol., Guangzhou, China
Volume
2
fYear
2010
fDate
10-11 July 2010
Firstpage
324
Lastpage
327
Abstract
Quality control is one of the important issues in the flexible printed circuit board (FPC) making industry. This paper propose a unsupervised defect detection approach based on wavelet packet fame for solving the problem of automatic inspection of Flexible Printed Circuit boards (FPC) gold surfaces. Detection of defects within the inspected texture of FPC gold surfaces is performed first by decomposing the gray level images into subbands using wavelet packet frame, then by extracting corresponding features from some important subbands selected according to their subwindow average energy, finally by reducing feature dimensions with principal component analysis (PCA) and thresholding the result feature images. A number of images of FPC gold surface with a variety of defects have been tested and the experimental results which yielded visually good segmentation confirm the validity of the proposed algorithm.
Keywords
automatic optical inspection; feature extraction; flexible electronics; gold; image segmentation; image texture; principal component analysis; printed circuit manufacture; printed circuit testing; printed circuits; quality control; surface texture; Au; PCA; automatic inspection; feature dimensions; feature extraction; feature image thresholding; flexible printed circuit board gold surfaces; flexible printed circuit board making industry; gray level image decomposition; principal component analysis; quality control; subwindow average energy; texture inspection; unsupervised defect detection; visual segmentation; wavelet packet frame; Feature extraction; Gold; Image recognition; Image segmentation; Manuals; Printed circuits; Surface waves; defect detection; flexible printed circuit board; gold surfaces; wavelet packet frame;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial and Information Systems (IIS), 2010 2nd International Conference on
Conference_Location
Dalian
Print_ISBN
978-1-4244-7860-6
Type
conf
DOI
10.1109/INDUSIS.2010.5565716
Filename
5565716
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