Title :
Non-invasive timing analysis of IBM G6 microprocessor L1 cache using backside time-resolved hot electron luminescence
Author :
Polonsky, S. ; Knebel, D. ; Sanda, P. ; McManus, M. ; Huott, W. ; Pelella, A. ; Manzer, D. ; Steen, S. ; Wilson, S. ; Yuen Chan
Author_Institution :
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
Abstract :
Picosecond imaging circuit analysis (PICA) is recently demonstrated to be a practical measurement technique of internal timing of ICs. This paper describes application of PICA to analysis of individual MOSFET switching times in the L1 cache write control circuits of the S/390 G6 microprocessor chip.
Keywords :
electroluminescence; hot carriers; integrated circuit testing; microprocessor chips; time resolved spectra; timing; IBM S/390 G6 microprocessor chip; L1 cache write control circuit; MOSFET switching time; backside time-resolved hot electron luminescence; noninvasive timing analysis; picosecond imaging circuit analysis; MOSFET circuits; Microprocessors; Nonlinear optics; Optical devices; Optical distortion; Semiconductor device measurement; Shape; Stimulated emission; Switching circuits; Timing;
Conference_Titel :
Solid-State Circuits Conference, 2000. Digest of Technical Papers. ISSCC. 2000 IEEE International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-5853-8
DOI :
10.1109/ISSCC.2000.839758
