• DocumentCode
    1967074
  • Title

    Fine-Grained Design Pattern Detection

  • Author

    Lebon, Maurice ; Tzerpos, Vassilios

  • Author_Institution
    Dept. of Comput. Sci. & Eng., York Univ., Toronto, ON, Canada
  • fYear
    2012
  • fDate
    16-20 July 2012
  • Firstpage
    267
  • Lastpage
    272
  • Abstract
    Design patterns have been used successfully to build well-organized, flexible software systems. In the reverse engineering field, detecting design patterns can simplify program comprehension by providing clues about the rationale behind the system´s design. However, the precision and recall of existing approaches to design pattern detection leave room for improvement. In this paper, we introduce a novel technique called FiG that complements existing detection methods by utilizing fine-grained static information contained in the software system. Our approach filters a large number of false positives by utilizing fine-grained rules that describe the static structure of a design pattern. We have implemented our approach in the context of the Eiffel programming language. Several experiments were performed to determine the effectiveness of the proposed approach.
  • Keywords
    object-oriented languages; software engineering; Eiffel programming language; fine grained design pattern detection; flexible software systems; object-oriented programming language; program comprehension; reverse engineering; Computer science; Context; Educational institutions; Production facilities; Prototypes; Software systems; design pattern detection; reverse engineering; software design patterns;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Software and Applications Conference (COMPSAC), 2012 IEEE 36th Annual
  • Conference_Location
    Izmir
  • ISSN
    0730-3157
  • Print_ISBN
    978-1-4673-1990-4
  • Electronic_ISBN
    0730-3157
  • Type

    conf

  • DOI
    10.1109/COMPSAC.2012.37
  • Filename
    6340155