Title :
Fine-Grained Design Pattern Detection
Author :
Lebon, Maurice ; Tzerpos, Vassilios
Author_Institution :
Dept. of Comput. Sci. & Eng., York Univ., Toronto, ON, Canada
Abstract :
Design patterns have been used successfully to build well-organized, flexible software systems. In the reverse engineering field, detecting design patterns can simplify program comprehension by providing clues about the rationale behind the system´s design. However, the precision and recall of existing approaches to design pattern detection leave room for improvement. In this paper, we introduce a novel technique called FiG that complements existing detection methods by utilizing fine-grained static information contained in the software system. Our approach filters a large number of false positives by utilizing fine-grained rules that describe the static structure of a design pattern. We have implemented our approach in the context of the Eiffel programming language. Several experiments were performed to determine the effectiveness of the proposed approach.
Keywords :
object-oriented languages; software engineering; Eiffel programming language; fine grained design pattern detection; flexible software systems; object-oriented programming language; program comprehension; reverse engineering; Computer science; Context; Educational institutions; Production facilities; Prototypes; Software systems; design pattern detection; reverse engineering; software design patterns;
Conference_Titel :
Computer Software and Applications Conference (COMPSAC), 2012 IEEE 36th Annual
Conference_Location :
Izmir
Print_ISBN :
978-1-4673-1990-4
Electronic_ISBN :
0730-3157
DOI :
10.1109/COMPSAC.2012.37