Title :
Highly Reliable CW and Pulsed GaAs Read Diodes
Author :
Long, S.I. ; Kinoshita, J. ; Fairman, R.D. ; Hamilton, R.J., Jr. ; Ku, I. ; Fank, F.B.
Author_Institution :
Varian Associates, 611 Hansen Way, Palo Alto, CA 94303
Abstract :
The development of GaAs Read Impatt diodes has resulted in the availability of reliable, long life, highly efficient CW and pulsed medium power devices. The use of a hi-lo Read structure with a grown GaAs p-n junction provides for the long life and highly efficient medium power devices. CW efficiencies in excess of 15% are routinely available at power levels of 2-3 watts. Pulse power outputs above 15 watts and with efficiencies of 20% are standard. For the pulsed devices, the results were obtained with a duty cycle of 25%. With these performances, lifetimes can be predicted to be in the 107 hour range for junction temperatures of 200°.
Keywords :
Circuit testing; Coaxial components; Conductors; Diodes; Epitaxial growth; Gallium arsenide; Impedance matching; P-n junctions; Packaging; Radio frequency;
Conference_Titel :
Microwave Conference, 1976. 6th European
Conference_Location :
Rome, Italy
DOI :
10.1109/EUMA.1976.332239