DocumentCode
1967168
Title
Replacing the DMM instrument in legacy ATE applications
Author
Diorio, Martin
Author_Institution
Northrop Grumman Corp., Rolling Meadows
fYear
2007
fDate
17-20 Sept. 2007
Firstpage
523
Lastpage
526
Abstract
A common problem facing all owners of automatic test equipment (ATE) is the obsolescence of instrumentation. That is, as the ATE progresses through its life cycle, the instrumentation within eventually becomes obsolete and is no longer maintainable. In many cases, this original instrumentation is "kept alive" for 20 years or longer. However, we must face the reality that the ATE instrumentation will eventually need to be upgraded with a functionally equivalent version that is currently available in today\´s marketplace. This "functional equivalence" between the old and new digital multi meters (DMM\´s) and potential approaches to dealing with these differences is the primary subject of this paper.
Keywords
automatic test equipment; digital multimeters; DMM; DMM instrument; automatic test equipment; digital multi meters; functional equivalence; legacy ATE applications; Automatic test equipment; Calibration; Costs; Current measurement; Electrical resistance measurement; Frequency measurement; Hardware; Instruments; System testing; Systems engineering and theory;
fLanguage
English
Publisher
ieee
Conference_Titel
Autotestcon, 2007 IEEE
Conference_Location
Baltimore, MD
ISSN
1088-7725
Print_ISBN
978-1-4244-1239-6
Electronic_ISBN
1088-7725
Type
conf
DOI
10.1109/AUTEST.2007.4374263
Filename
4374263
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