DocumentCode :
1967168
Title :
Replacing the DMM instrument in legacy ATE applications
Author :
Diorio, Martin
Author_Institution :
Northrop Grumman Corp., Rolling Meadows
fYear :
2007
fDate :
17-20 Sept. 2007
Firstpage :
523
Lastpage :
526
Abstract :
A common problem facing all owners of automatic test equipment (ATE) is the obsolescence of instrumentation. That is, as the ATE progresses through its life cycle, the instrumentation within eventually becomes obsolete and is no longer maintainable. In many cases, this original instrumentation is "kept alive" for 20 years or longer. However, we must face the reality that the ATE instrumentation will eventually need to be upgraded with a functionally equivalent version that is currently available in today\´s marketplace. This "functional equivalence" between the old and new digital multi meters (DMM\´s) and potential approaches to dealing with these differences is the primary subject of this paper.
Keywords :
automatic test equipment; digital multimeters; DMM; DMM instrument; automatic test equipment; digital multi meters; functional equivalence; legacy ATE applications; Automatic test equipment; Calibration; Costs; Current measurement; Electrical resistance measurement; Frequency measurement; Hardware; Instruments; System testing; Systems engineering and theory;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Autotestcon, 2007 IEEE
Conference_Location :
Baltimore, MD
ISSN :
1088-7725
Print_ISBN :
978-1-4244-1239-6
Electronic_ISBN :
1088-7725
Type :
conf
DOI :
10.1109/AUTEST.2007.4374263
Filename :
4374263
Link To Document :
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