• DocumentCode
    1967168
  • Title

    Replacing the DMM instrument in legacy ATE applications

  • Author

    Diorio, Martin

  • Author_Institution
    Northrop Grumman Corp., Rolling Meadows
  • fYear
    2007
  • fDate
    17-20 Sept. 2007
  • Firstpage
    523
  • Lastpage
    526
  • Abstract
    A common problem facing all owners of automatic test equipment (ATE) is the obsolescence of instrumentation. That is, as the ATE progresses through its life cycle, the instrumentation within eventually becomes obsolete and is no longer maintainable. In many cases, this original instrumentation is "kept alive" for 20 years or longer. However, we must face the reality that the ATE instrumentation will eventually need to be upgraded with a functionally equivalent version that is currently available in today\´s marketplace. This "functional equivalence" between the old and new digital multi meters (DMM\´s) and potential approaches to dealing with these differences is the primary subject of this paper.
  • Keywords
    automatic test equipment; digital multimeters; DMM; DMM instrument; automatic test equipment; digital multi meters; functional equivalence; legacy ATE applications; Automatic test equipment; Calibration; Costs; Current measurement; Electrical resistance measurement; Frequency measurement; Hardware; Instruments; System testing; Systems engineering and theory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Autotestcon, 2007 IEEE
  • Conference_Location
    Baltimore, MD
  • ISSN
    1088-7725
  • Print_ISBN
    978-1-4244-1239-6
  • Electronic_ISBN
    1088-7725
  • Type

    conf

  • DOI
    10.1109/AUTEST.2007.4374263
  • Filename
    4374263