DocumentCode :
1967516
Title :
Cost effective high performance modular instrumentation, signal generation and signal analysis for future mobile communication systems
Author :
Andersen, Olav ; Wisell, David ; Keskitalo, Niclas ; Stenvard, Patrik
Author_Institution :
Ericsson AB, Gaevle
fYear :
2007
fDate :
17-20 Sept. 2007
Firstpage :
660
Lastpage :
668
Abstract :
A decrease in life cycle cost is a key issue for testing of mobile communication systems. The rapid development and edge technology requires high performance instruments and state of the art measurement technology. It is desired to use virtual/synthetic instruments and put the measurement technology in software independent of hardware, i.e. software driven measurements. Increased flexibility and modularization, both in hardware and software, are requirements to support the cost decrease. The hardware basis is signal generation and signal analysis. In this paper state of the art signal generation and signal analysis capabilities are demonstrated in a modular and flexible architecture. A direct IF synthesis is used to generate 1 WideBand Code-Division Multiple Access (WCDMA) carrier with more than 72 dB Adjacent Carrier Leakage Ratio (ACLR) 2 carrier with more than 68 dBc ACLR over a total bandwidth of 100 MHz. The signal analysis capabilities, ACLR performance, for a WCDMA carrier is better than -70 dBc and for a continuous wave better than -85 dBc over a bandwidth of 42.5 MHz. The critical down converter in the set up doesn´t degrade the performance.
Keywords :
mobile communication; signal generators; signal processing equipment; telecommunication equipment testing; ACLR; WCDMA; adjacent carrier leakage ratio; flexible architecture; high performance instruments; mobile communication systems testing; modular instrumentation; signal analysis; signal generation; wideband code-division multiple access; Bandwidth; Costs; Hardware; Instruments; Life testing; Mobile communication; Multiaccess communication; Signal analysis; Signal generators; Software measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Autotestcon, 2007 IEEE
Conference_Location :
Baltimore, MD
ISSN :
1088-7725
Print_ISBN :
978-1-4244-1239-6
Electronic_ISBN :
1088-7725
Type :
conf
DOI :
10.1109/AUTEST.2007.4374282
Filename :
4374282
Link To Document :
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