Speeding Up Analog Integration and Test for Mixed-Signal SoCs [From the EIC]
Author :
Ivanov, Alexander
Volume :
32
Issue :
1
fYear :
2015
fDate :
Feb. 2015
Firstpage :
4
Lastpage :
5
Abstract :
Presents an editorial that addresses the main topics discussed in this issue focusing on the complex challenges of design, verification, and test of analog and mixed-signal circuits and SoCs.
