• DocumentCode
    1967616
  • Title

    Reconfigurable tester hardware extends JTAG/boundary scan applications while simplifying ate setup

  • Author

    Ehrenberg, Heiko

  • Author_Institution
    GOEPEL Electron. LLC, Austin
  • fYear
    2007
  • fDate
    17-20 Sept. 2007
  • Firstpage
    712
  • Lastpage
    717
  • Abstract
    Boundary Scan (often also referred to as JTAG) as defined in IEEE Std. 1149.1 has been adopted by many design and test engineers as test methodology for prototype verification and for production testing. This successful and powerful technology has a few limitations, though, some of which can be overcome with newer test standards, such as IEEE 1149.4 and IEEE 1149.6. Still, practically all electronic products need to undergo a functional test before they leave the manufacturing floor. Functional tests, however, require manual, labor intensive and costly test development and often times ad-hoc test equipment configurations. This paper discusses the benefits of combining boundary scan tools with functional test equipment, with a focus on extended boundary scan applications based on reconfigurable tester hardware.
  • Keywords
    automatic test equipment; boundary scan testing; electronic equipment testing; electronics industry; reliability; ATE setup; JTAG; boundary scan tools; electronic products; functional tests; production testing; prototype verification; reconfigurable tester hardware; Circuit faults; Circuit testing; Electronic equipment testing; Fixtures; Hardware; Logic testing; Pins; Prototypes; System testing; Test equipment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Autotestcon, 2007 IEEE
  • Conference_Location
    Baltimore, MD
  • ISSN
    1088-7725
  • Print_ISBN
    978-1-4244-1239-6
  • Electronic_ISBN
    1088-7725
  • Type

    conf

  • DOI
    10.1109/AUTEST.2007.4374289
  • Filename
    4374289