Title :
Optimization of low voltage metallized film capacitor geometry
Author :
Vuillermet, Y. ; Chacebe, O. ; Lupin, J.M. ; Saker, A. ; Meunier, G. ; Coulomb, J.L.
Author_Institution :
Lab. Electrotechnique de Grenoble, ENSIEG, Grenoble
Abstract :
Thermal constraint is one of the major cause of capacitor failures. In this paper, a loss model, based on electrode current distribution, is firstly established to determine, by numerical simulation, a temperature mapping of capacitor. This mapping is successfully compared to measurements. Then a shape optimization is led in order to find parameters that give the best lifespan and the larger reactive power provided
Keywords :
current distribution; electrodes; fault diagnosis; numerical analysis; power capacitors; reactive power; capacitor failures; capacitor temperature mapping; electrode current distribution; loss model; metallized film capacitor geometry optimization; numerical simulation; reactive power; shape optimization; thermal constraint; Capacitors; Current distribution; Electrodes; Geometry; Low voltage; Metallization; Numerical simulation; Reactive power; Shape; Temperature distribution;
Conference_Titel :
Electromagnetic Field Computation, 2006 12th Biennial IEEE Conference on
Conference_Location :
Miami, FL
Print_ISBN :
1-4244-0320-0
DOI :
10.1109/CEFC-06.2006.1633259
