• DocumentCode
    1967827
  • Title

    A 2.5 MSample/s multi-bit /spl Delta//spl Sigma/ CMOS ADC with 95 dB SNR

  • Author

    Geerts, Y. ; Steyaert, M. ; Sansen, W.

  • Author_Institution
    Katholieke Univ., Leuven, Heverlee, Belgium
  • fYear
    2000
  • fDate
    9-9 Feb. 2000
  • Firstpage
    336
  • Lastpage
    337
  • Abstract
    /spl Delta//spl Sigma/ A/D converters combine high resolution and high speed. A significant improvement in performance is achieved by employing a multi-bit quantizer. However, the linearity requirements for the DAC in the feedback loop are severe. To relax these requirements, dynamic element matching (DEM) techniques such as data weighted averaging (DWA) are used, converting noise and distortion introduced by the non-ideal DAC into a noise shaped error. These DEM techniques require an additional digital block in the feedback loop of the converter to scramble the used unity elements in each clock period. The delay introduced in the feedback loop by this block imposes a limit on the maximum clock frequency of the converter. Here, implementation of the DWA algorithm is optimized for high-speed converters, resulting in a 2.5MSample/s 16b A/D converter in a 0.65 /spl mu/m CMOS technology operating at 60 MHz clock speed.
  • Keywords
    CMOS integrated circuits; circuit feedback; high-speed integrated circuits; integrated circuit noise; quantisation (signal); sigma-delta modulation; 0.65 micron; 16 bit; 60 MHz; CMOS; SNR; clock frequency; clock period; data weighted averaging; digital block; dynamic element matching; feedback loop; high-speed converters; linearity requirements; multi-bit quantizer; multi-bit sigma-delta ADC; noise shaped error; resolution; speed; unity elements; CMOS technology; Capacitance; Clocks; Delay; Feedback loop; Multi-stage noise shaping; Output feedback; Switches; Timing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 2000. Digest of Technical Papers. ISSCC. 2000 IEEE International
  • Conference_Location
    San Francisco, CA, USA
  • ISSN
    0193-6530
  • Print_ISBN
    0-7803-5853-8
  • Type

    conf

  • DOI
    10.1109/ISSCC.2000.839805
  • Filename
    839805