Title :
Error correcting code for flash memories
Author :
Jiang, Aimin ; Yue Li ; Gad, E.E. ; Langberg, Michael ; Bruck, Jehoshua
Author_Institution :
Dept. of Comput. Sci. & Eng., Texas A&M Univ., College Station, TX, USA
Abstract :
Flash memories have many distinct properties, which affect the design of error correcting codes. In this paper, we combine error correction with rewriting, and present such a code construction based on polar coding.
Keywords :
error correction codes; flash memories; code construction; error correcting code design; flash memories; polar coding; Ash; Decoding; Encoding; Error correction codes; Error probability; Noise; Noise measurement;
Conference_Titel :
Information Theory and Applications Workshop (ITA), 2013
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4673-4648-1
DOI :
10.1109/ITA.2013.6502943
