Title :
Thin Crack Modeling in ECT with Combined Potential Formulations
Author :
Choua, Y. ; Santandrea, L. ; Le Bihan, Y. ; Marchand, C.
Author_Institution :
Lab. de Genie Electrique de Paris, Supelec, Gif-sur-Yvette
Abstract :
The finite element modeling of thin cracks in ECT using a-psi and t-Phi combined vector-scalar potential formulations is presented with edge and nodal Whitney element discretization. The crack is treated as a non-conductive surface on which appropriate conditions are applied. A team workshop benchmark problem has been solved
Keywords :
eddy current testing; finite element analysis; surface cracks; surface treatment; combined vector-scalar potential formulations; eddy current testing; finite element modeling; nodal Whitney element discretization; nonconductive surface treatment; team workshop benchmark problem; thin crack modeling; Current density; Electric potential; Electrical capacitance tomography; Finite element methods; Insulation; Magnetic fields; Probes; Surface cracks; Surface resistance; Surface treatment;
Conference_Titel :
Electromagnetic Field Computation, 2006 12th Biennial IEEE Conference on
Conference_Location :
Miami, FL
Print_ISBN :
1-4244-0320-0
DOI :
10.1109/CEFC-06.2006.1633288
