DocumentCode
1968447
Title
A 660 MHz self-resetting 8 port, 32/spl times/64 bits register file and latch in 0.25 /spl mu/m SOI technology
Author
Joshi, R.V. ; Hwang, Wei ; Henkels, W.H. ; Wilson, S. ; Rausch, W. ; Shahidi, G.
Author_Institution
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
fYear
1998
fDate
5-8 Oct. 1998
Firstpage
131
Lastpage
132
Abstract
Design issues associated with dynamic circuits such as collisions, pulse widening, and noise margins are anticipated to be very sensitive to SOI process and device conditions. Multi-port dynamic register files and latches are important elements in current microprocessors. We designed such a register file and latch for bulk silicon technology, but it can be fabricated in SOI technology without any body contacts. The register file and latch function at frequencies higher than 660 MHz. The salient features are low voltage operability, fully collision-free operation and minimum noise. A robust design is demonstrated with respect to input pulse width variation and skew margins. Charge sharing noise and noise due to leakage coupling and power supply variations are controlled using half latches on the dynamic nodes and by properly optimizing circuits and layouts.
Keywords
circuit optimisation; flip-flops; integrated circuit design; integrated circuit noise; integrated circuit testing; leakage currents; logic design; logic testing; microprocessor chips; shift registers; silicon-on-insulator; 0.25 micron; 32 bit; 64 bit; 660 MHz; SOI device conditions; SOI process conditions; SOI technology; Si-SiO/sub 2/; body contacts; charge sharing noise; circuit layout optimization; circuit optimization; dynamic circuit collisions; dynamic circuit design; dynamic latches; dynamic node half-latches; fully collision-free operation; input pulse width variation; leakage coupling noise; low voltage operability; microprocessors; minimum noise; multi-port dynamic register files; noise margins; power supply variation noise; pulse widening; self-resetting latch; self-resetting register file; skew margins; Circuit noise; Frequency; Latches; Low voltage; Microprocessors; Noise robustness; Pulse circuits; Registers; Silicon; Space vector pulse width modulation;
fLanguage
English
Publisher
ieee
Conference_Titel
SOI Conference, 1998. Proceedings., 1998 IEEE International
Conference_Location
Stuart, FL, USA
ISSN
1078-621X
Print_ISBN
0-7803-4500-2
Type
conf
DOI
10.1109/SOI.1998.723146
Filename
723146
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