Title :
Integrated Optical Technique for Detection of Electro-Optical Non-Linearities in Thin Films
Author :
Aglieri, S. ; Calì, C. ; Daneu, V. ; Riva-Sanseverino, S.
Author_Institution :
Instituto di Elettrotecnica ed Elettronica, UniversitÃ\xa0 di Palermo, Viale delle Scienze, 90128 Palermo (Italy)
Abstract :
A simple method for detection of electro-optical non-linearities in thin films is presented. The method involves an easily fabricated structure and a little practice in integrated optical techniques. It is also possible to detect small induced variations of refractive index, using lower voltage with respect to those applied in a conventional Kerr cell. We have sucessfully tested our method using two different polymer materials as thin films. In both of these we have observed an induced ¿n ¿ 3 10¿5 with an electric field of 60 V/¿, with a response time round about 300 nsec. The experimental values of induced ¿n versus electric field fit very well a parabola, proving the quadratic behavior of Kerr effect.
Keywords :
Integrated optics; Nonlinear optics; Optical detectors; Optical films; Optical polymers; Optical refraction; Optical variables control; Polymer films; Refractive index; Transistors;
Conference_Titel :
Microwave Conference, 1976. 6th European
Conference_Location :
Rome, Italy
DOI :
10.1109/EUMA.1976.332312