Title :
Investigation of a SPR waveguide sensor based on angular interrogation
Author :
Fan, Shiqi ; Li, Mingyu ; He, Jian-Jun
Author_Institution :
Center for Integrated Optoelectron., Zhejiang Univ., Hangzhou, China
Abstract :
A novel angular interrogation SPR waveguide sensor based on SOI material is theoretically investigated. The parameters of the sensor such as the thickness of Au and Ti film are optimized.
Keywords :
optical waveguides; silicon-on-insulator; SPR; angular interrogation; waveguide sensor; Coatings; Films; Gold; Optical waveguides; Reflection; Waveguide theory;
Conference_Titel :
Communications and Photonics Conference and Exhibition (ACP), 2010 Asia
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-7111-9
DOI :
10.1109/ACP.2010.5682583
