DocumentCode
1968751
Title
Film Mode Attenuation Due to Random Surface Irregularities
Author
Hinken, J.H.
Author_Institution
c/o Institut f?r Hochfrequenztechnik, Technische Universit?t, Postfach 3329, 3300 Braunschweig, W-Germany
fYear
1976
fDate
14-17 Sept. 1976
Firstpage
513
Lastpage
517
Abstract
A method for the approximate calculation of the attenuation constant of dielectric film modes due to small two dimensional random boundary deviations from eveness is presented. The irregularities are replaced by effective sources, the radiated power of which accounts for the loss, suffered by an incident mode. Results for the H0-and E0-mode are plotted versus their film asymmetry parameters. When the deviations are assumed to be grooves transvers to the propagation direction, the problem becomes two dimensional and the results show good agreement with an earlier more accurate treatment.
Keywords
Attenuation; Costs; Dielectric films; Dielectric losses; Dielectric substrates; Geometry; Manufacturing; Optical films; Refractive index; Scattering;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference, 1976. 6th European
Conference_Location
Rome, Italy
Type
conf
DOI
10.1109/EUMA.1976.332328
Filename
4130994
Link To Document