Characterization of the electro-absorption modulator chirp using modulated-transmission spectroscopy

Author

Kim, In ; Lee, Sang-Dong ; Cho, Shi-Yun ; Lee, Eun-Hwa ; Choo, Ahn-Goo ; Kim, Tae-II

Author_Institution

Optoelectronics Div., Samsung Electron., Suwon, South Korea

Volume

1

fYear

2001

fDate

2001

Firstpage

42

Abstract

The electroabsorption modulator still shows large transient chirp and thus is hard to operate at higher bit rate without a high insertion loss. To overcome this obstacle, it is imperative to fully understand the chirp characteristics caused by Stark effect in the multiple quantum-well (MQW) structures. This work presents a simple experimental method of measuring MQW electro-absorption and the chirp parameter

Keywords

Stark effect; chirp modulation; electro-optical modulation; electroabsorption; modulation spectroscopy; optical communication equipment; optical testing; semiconductor quantum wells; MQW electro-absorption; Stark effect; chirp characteristics; chirp parameter; electro-absorption modulator chirp; high insertion loss; higher bit rate; large transient chirp; modulated-transmission spectroscopy; multiple quantum-well structures; Absorption; Bit rate; Chirp modulation; Extinction ratio; Optical amplifiers; Optical fiber networks; Quantum well devices; Shape measurement; Spectroscopy; Wavelength measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Lasers and Electro-Optics Society, 2001. LEOS 2001. The 14th Annual Meeting of the IEEE

Conference_Location

San Diego, CA

ISSN

1092-8081

Print_ISBN

0-7803-7105-4

Type

conf

DOI

10.1109/LEOS.2001.969163

Filename

969163