DocumentCode :
1968797
Title :
Notice of Retraction
High Temperature Failure Mechanism of Multi-layer Ceramic Capacitor
Author :
Bo Li ; Ya Zhang ; Hongxiang Zhang
Author_Institution :
Mech. & Electron. Eng. Inst., North Univ. of China, Taiyuan, China
fYear :
2010
fDate :
30-31 Jan. 2010
Firstpage :
62
Lastpage :
64
Abstract :
Notice of Retraction

After careful and considered review of the content of this paper by a duly constituted expert committee, this paper has been found to be in violation of IEEE´s Publication Principles.

We hereby retract the content of this paper. Reasonable effort should be made to remove all past references to this paper.

The presenting author of this paper has the option to appeal this decision by contacting TPII@ieee.org.

Lacking of knowing the performance parameters of electrical products can lead to misunderstand the stability of the system. And Multi-layer ceramic condenser (MLCC) as a main class of chip electronic component and a new kind of component, its properties is closely related to the dielectric materials. Then the characteristics of MLCC is introduced in this paper, and the stability of MLCC on temperature is also discussed, discussed the reason of the capacity change by a wide margin under the high-temperature condition, and given some suggestion on the applying methods of MLCC.
Keywords :
ceramic capacitors; failure analysis; capacity change; chip electronic component; dielectric materials; high-temperature condition; high-temperature failure mechanism; multilayer ceramic capacitor; Capacitance; Capacitors; Ceramics; Dielectrics; Electrical products; Electrodes; Electrons; Failure analysis; Ocean temperature; Stability; high temperature experiment; high temperature failure; multi-layer ceramic capacitor; temperature characteristics research;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Innovative Computing & Communication, 2010 Intl Conf on and Information Technology & Ocean Engineering, 2010 Asia-Pacific Conf on (CICC-ITOE)
Conference_Location :
Macao
Print_ISBN :
978-1-4244-5634-5
Type :
conf
DOI :
10.1109/CICC-ITOE.2010.23
Filename :
5439292
Link To Document :
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