• DocumentCode
    1969540
  • Title

    Frontend ICs for impulse radio sensing and communications

  • Author

    Schumacher, H. ; Lin, D. ; Trasser, A.

  • Author_Institution
    Inst. of Electron Devices & Circuits, Ulm Univ., Ulm, Germany
  • fYear
    2012
  • fDate
    17-20 Sept. 2012
  • Firstpage
    21
  • Lastpage
    25
  • Abstract
    The chipsets discussed in this paper follow the philosophy that the beauty of impulse radio ultra-wideband lies in its simplicity. They provide fully differential circuit solutions in a low-cost SiGe heterostructure bipolar transistor technology addressing short range radar sensors as well as communication links. At the core, an efficient pulse generator concept allows for spectral tunability as well as biphase modulated pulses. Receiver concepts implement correlation detection for radar and biphase modulation, and energy detection for on-off keying communications and localization. Finally, a successful approach to rapid turn-around transmit/receive modules for monostatic IR UWB radars is presented.
  • Keywords
    Ge-Si alloys; amplitude shift keying; heterojunction bipolar transistors; phase modulation; pulse generators; radar detection; radar receivers; radio links; radiofrequency integrated circuits; semiconductor materials; sensor placement; ultra wideband communication; ultra wideband radar; SiGe; biphase modulated pulses; biphase modulation; communication links; correlation detection; differential circuit; frontend IC; impulse radio sensing; impulse radio ultrawideband communication; low-cost heterostructure bipolar transistor technology; monostatic IR UWB radars; on-off keying communications; pulse generator; receiver; short range radar sensors; spectral tunability; transmit-receive modules; Correlation; Integrated circuits; Pulse generation; Receivers; Ultra wideband radar; Microwave integrated circuits; Ultra wideband radar; Ultra wideband technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultra-Wideband (ICUWB), 2012 IEEE International Conference on
  • Conference_Location
    Syracuse, NY
  • ISSN
    2162-6588
  • Print_ISBN
    978-1-4577-2031-4
  • Type

    conf

  • DOI
    10.1109/ICUWB.2012.6340407
  • Filename
    6340407