• DocumentCode
    1969648
  • Title

    Honey- bees mating algorithm applied to feasible design target space for a wide- band front- end amplifier

  • Author

    Mahouti, Peyman ; Gunec, Filiz ; Demirel, Salih

  • Author_Institution
    Electron. & Commun. Eng. Dept., Yildiz Tech. Univ., Istanbul, Turkey
  • fYear
    2012
  • fDate
    17-20 Sept. 2012
  • Firstpage
    251
  • Lastpage
    255
  • Abstract
    In this article, the feasible design target space is determined for the input stage-requirements of an ultra-wide band low-noise front end design using a single transistor. The problem is set as an optimization problem where honey-bees mating have been used as search and optimization tool within in the problem domain. The primary reason to use this algorithm is ease of its use, broad applicability and global perspective. The honey-bee mating process has been considered as a typical swarm-based approach to optimization, in which the search algorithm is inspired by the process of honey-bee mating in real life. In this paper, the honey-bee mating (HBMO) algorithm is presented as a new meta-heuristic optimizationtool to determine design target space for a microwave amplifier subject to the potential performance of the employed transistor.
  • Keywords
    microwave amplifiers; microwave transistors; particle swarm optimisation; search problems; HBMO algorithm; feasible design target space; honey-bee mating process; honey-bees mating algorithm; meta-heuristic optimization tool; microwave amplifier; optimization problem; search algorithm; single transistor; swarm-based approach; ultra-wide band low-noise front end design; wide-band front-end amplifier; Algorithm design and analysis; Genetics; Microwave amplifiers; Microwave antenna arrays; Optimization; Search problems; Transistors; Feasible Design Target Space; Honey- Bees Mating Algorithm; Input VSWR; Noise Figure; Optimization; Stability; Transducer Gain;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultra-Wideband (ICUWB), 2012 IEEE International Conference on
  • Conference_Location
    Syracuse, NY
  • ISSN
    2162-6588
  • Print_ISBN
    978-1-4577-2031-4
  • Type

    conf

  • DOI
    10.1109/ICUWB.2012.6340411
  • Filename
    6340411