Title :
Proceedings Design, Automation and Test in Europe Conference and Exhibition 2000 (Cat. No. PR00537)
Abstract :
The following topics were dealt with: embedded software generation; low-power design; IC design; IP; design reuse; SOC; telecom systems; BIST; mixed-signal ICs; decision diagrams; multiprocessor architectures; logic synthesis; logic testing; interconnect modelling; high-level power optimisation; defect-oriented test; and emulation
Keywords :
application specific integrated circuits; built-in self test; decision diagrams; development systems; embedded systems; industrial property; integrated circuit design; integrated circuit interconnections; integrated circuit modelling; logic CAD; logic testing; low-power electronics; mixed analogue-digital integrated circuits; multiprocessing systems; telecommunication equipment; BIST; IC design; IP; SOC; decision diagrams; defect-oriented test; design reuse; embedded software generation; emulation; high-level power optimisation; interconnect modelling; logic synthesis; logic testing; low-power design; mixed-signal ICs; multiprocessor architectures; telecom systems;
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition 2000. Proceedings
Conference_Location :
Paris, France
Print_ISBN :
0-7695-0537-6
DOI :
10.1109/DATE.2000.840006
